FADOS XI Advanced VI Analyzer

FADOS XI Advanced VI Analyzer

The FADOS XI Advanced VI Analyzer is a powerful professional diagnostic instrument designed for troubleshooting, testing, and repairing electronic circuit boards.

Combining VI curve testing, 3D frequency scanning, non-contact short-circuit detection, automatic component recognition, RLC measurement, programmable DC power, IR temperature measurement, memory comparison, and oscilloscope functions, the FADOS XI gives technicians a complete set of tools for advanced PCB fault analysis.

The analyzer can automatically identify a wide range of electronic components, including transistors, FETs, IGBTs, TRIACs, thyristors, and other semiconductor devices. It can also create equivalent circuit diagrams and generate detailed test reports in Excel and JPG formats.

With dual-channel testing and automatic comparison of known-good and faulty boards, the FADOS XI helps locate defective components quickly—often without removing them from the circuit.

Main Benefits

• Diagnose electronic circuit boards faster and more accurately.
• Perform dual-channel VI curve testing.
• Detect short circuits without direct contact using the advanced sensor and software.
• Scan circuit behavior across frequencies from 100 Hz to 2500 Hz.
• View detailed 3D VI graphs in multiple display modes.
• Automatically generate equivalent circuit diagrams.
• Measure resistance, inductance, capacitance, and diode characteristics.
• Identify transistors, FETs, IGBTs, TRIACs, thyristors, and other components.
• Compare current measurements with previously recorded memory data.
• Locate overheating components using non-contact IR temperature measurement.
• Apply controlled power with an adjustable 16 V / 1.5 A DC power supply.
• Create professional fault reports in Excel and JPG formats.
• Use built-in oscilloscope and signal-output functions for advanced testing.

Key Features

Dual-Channel VI Testing

Compare two test points, components, or board sections simultaneously using dual-channel VI analysis. This helps identify differences between a working board and a faulty board.

Non-Contact Short-Circuit Detection

The advanced FADOS XI model includes a sensor and software system for locating short circuits without physically touching every part of the board. This can reduce diagnostic time and help identify hidden faults.

3D Frequency Scanning

The analyzer scans circuit responses from 100 Hz to 2500 Hz and displays the results as a 3D VI graph. Multiple display modes and comparison functions make unusual circuit behavior easier to recognize.

Automatic Component Identification

The FADOS XI can automatically identify several component types, including:

• Transistors
• FETs
• IGBTs
• TRIACs
• Thyristors
• Diodes
• Resistors
• Capacitors
• Inductors
• Other semiconductor components

Automatic Equivalent Circuit Diagram

The software can generate an equivalent circuit diagram based on the measured component or circuit response. This provides useful visual assistance during troubleshooting and analysis.

Memory Recording and Comparison

Record test data from known-good boards or components and compare it with measurements from faulty units. This is useful for repetitive repairs, production testing, and service documentation.

Adjustable DC Power Supply

The built-in adjustable DC power supply provides up to 16 V and 1.5 A for controlled power testing. The system can automatically adjust voltage, current, and frequency steps while displaying the power test graph.



IR Temperature Measurement

Use the non-contact IR temperature probe to locate overheated components, abnormal hot spots, shorted areas, and power-rail problems.

Built-In Oscilloscope and Signal Outputs

The FADOS XI also includes oscilloscope functionality and signal outputs, including:

• Square-wave output
• Analog signal output
• Oscilloscope testing
• Automatic voltage, current, and frequency step selection